Scanning Probe Microscopy(SPM)

time:2016-05-17Hits:10设置


Instrument name

Scanning Probe Microscopy(SPM)

Manufacturers

Bruker (Veeco company)

Specifications

1Noise<0.3 A MS in vertical (Z) dimension with vibration isolation

2sample size: 10 um diameter; 5 um thick

Applications and Uses

The Multimode V performs a full range of SPM techniques for 

surface characterization of properties like topography, elasticity, 

friction, adhesion, and electrical and magnetic fields.

Accessories

STMC-AFMEFMMFM

ContactsHaihua Wu

Contact number65881259

E-mailhhwu@suda.edu.cn

Editor: Haihua Wu















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