1.Wafer Chuck: Up to 4 inch
2.Temperature Control: From 25℃ to 300℃
3. Amplification of Microscope: Optical 400 times
4. Leakage Current: ≤50 fA
Applications and Uses
The probe station is widely used in the field of I-V/C-V measurments, device characterization, submicron probing, optoelectronic engineering tests and more.
Contact: Mingfa Peng
Editor: Mingfa Peng